McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West
SIMI VALLEY, Calif., July 2, 2010 — McBain Systems of Simi Valley announced that it will be exhibiting at the Semicon West show in San Francisco later this month. McBain will show its recently introduced near-infrared (NIR) defect detection and review (DDR) stations as well as its automated wafer…
